The instrument is dedicated to the electromechanical characterization of MEMS sensors. Without the need of any interface board,
it easily delivers relevant information about the MEMS under test (rest capacitance, stationary CV curves with pull-in and pull-out,
resonance frequency and Q factor time-domain and frequency-domain analysis).
Dedicated LabVIEW routines are developed for the characterization of fatigue, adhesion phenomena, quadrature error evaluation in gyroscopes,
and nonlinearity characterization of resonant structures.
The system includes the generation of single-ended or push-pull driving stimuli up to 40 V and 500 kHz, and a differential capacitive or piezoresistive readout.